Characterizing Slow state Near Si-SiO2 in MOS structure

Citation:

Guenifi, Naima. 2017. “Characterizing Slow state Near Si-SiO2 in MOS structure”. International Conference on Phosphorus, Boron and Silicon 2017.

Publisher's Version

See also: Communications Internationales, Équipe 4 TSC, Catégorie C TSC

Last updated on 07/12/2022

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