Cost-effective multispectral photodetectors (PDs) exhibiting a high UV-Visible-NIR photoresponse offer an avenue for developing environmental monitoring devices, imaging sensors, object discrimination, and optical links. However, PDs based on a single semiconductor as light-sensitive layer are unable to provide broadband photodetection properties. In this work, a new PD device based on ZnO-ZnS Microstructured Composite (MC) which achieves a high UV-Visible-NIR photoresponse is demonstrated. The ZnO-ZnS MC is elaborated by combining vacuum thermal evaporation technique and a suitable annealing process. Scanning Electron Microscopy (SEM), energy-dispersive X-ray spectroscopy (EDS), X-ray diffraction (XRD), and UV-Vis-NIR spectroscopy were used to elucidate the morphological, structural and optical properties of the prepared sample. It was demonstrated that the ZnO-ZnS MC can be useful to enhance the visible absorbance efficiency by promoting efficient light-scattering effects. It is revealed that the prepared UV-Vis-NIR PD offers a low dark current of 5 nA, a high I_ON/I_OFF ratio of 78 dB and an enhanced responsivity in UV, visible and NIR ranges. The proposed multispectral PD demonstrates a high I_ON/I_OFF current ratio under self-powered working regime. Therefore, the proposed ZnO-ZnS MC is believed to provide new insights in developing efficient, self-powered and low-cost multispectral PDs for high-performance optoelectronic systems.

In this paper, a new efficient and low-cost Schottky Diode (SD) based on a-Si/Ti structure was elaborated using RF magnetron sputtering technique. An exhaustive investigation of structural and electrical properties was performed, where the sputtered device was characterized using X-ray diffraction (XRD) and Keithley (4200-SCS) to measure the current-voltage characteristics. Moreover, a comprehensive study regarding the impact of the Ti layers on the device characteristics is carried out. It was demonstrated that implementing Ti intermediate layers could induce depletion regions at the interfaces, leading to significantly enlarged voltage barrier height. Furthermore, the elaborated SD exhibits a rectification behavior providing an appropriate current with a favorable ideality factor. This is mainly due to the reduced series resistance of the multilayer structure as confirmed by electrical analysis. Therefore, the proposed SD structure based on Ti intermediate layers provides improved performance and can open a new route for the fabrication of promising alternative devices for microelectronic and sensing applications.

In this paper, the optimization, elaboration and characterization of an efficient spectral beam splitter based on a simple RF sputtered ITO/Ag/ITO (IAI) ultra-thin multilayer structure are presented. An experimental investigation assisted by Genetic Algorithm (GA) metaheuristic optimization was carried out to achieve high-performance spectral splitter for tandem solar cell applications. The RF magnetron sputtering method was used to elaborate the optimized IAI structure. The optical and structural properties of the sputtered splitter were also analyzed using UV–Vis-IR spectroscopy and X-ray diffraction (XRD) measurements. It is found that the elaborated splitter structure offers 84% of transparency and a high reflectance of 87% with an optimum cut-off wavelength of 800 nm. This is attributed to the design approach, which leads to promote spectral splitting mechanism by inducing efficient optical modulation. Interestingly, a new Figure of Merit (FoM) parameter, which evaluates the optical splitting performances is proposed. Moreover, a new Perovskite/InGaAs tandem cell is proposed and analyzed to show the impact of the elaborated spectrum splitter on the solar cell efficiency. It is revealed that the investigated solar cell exhibits an improved efficiency approaching 30%. The latter value far surpasses that provided by Perovskite tandem cells. These results indicate that our spectrum splitting approach can open a new pathway towards designing high-performance tandem photovoltaic devices.

High-performance multispectral photodetectors (PDs) are highly attractive for the emerging optoelectronic applications. In this work, a new broadband PD based on p-NiO/Ag/n-ITO heterostructure was fabricated by RF magnetron sputtering technique at room temperature. The tri-layered structure offering multispectral detection property was first identified using theoretical calculations based on combined FDTD and Particle Swarm Optimization (PSO) techniques. The crystal structure of the elaborated sensor was analyzed using X-ray diffraction (XRD) method. The device optical properties were investigated by UV–Vis–NIR spectroscopy. The NiO/Ag/ITO heterostructured PD shows a high average absorbance of 63% over a wide spectrum range of [200 nm–1100nm]. Compared with NiO and ITO thin-films, the performances of the heterostructured device are considerably enhanced. It was found that the prepared PD with NiO/Ag/ITO heterostructure merges the benefits of multispectral photodetection with reduced optical losses and efficient transfer of photo-induced carrier. The device demonstrated a high I_ON/I_OFF ratio of 78 dB and an enhanced responsivity under UV, visible and NIR lights (171 mA/W at 365 nm, 67 mA/W at 550 nm and 93 mA/W at 850 nm). The broadband photodetection property enabled by the optimized NiO/Ag/ITO heterostructure opens a new route for the elaboration of low-cost devices that can offer multiple sensing purposes, which are highly suitable for optoelectronic applications.

The rapid progress of wide band gap SiC semiconductor material opens up new opportunities to develop efficient monolithically integrated ultraviolet (UV) photonic and power systems for a wide range of advanced applications. In this paper, low-noise solar-blind UV photodetector (PD) based on all-amorphous ZnO/SiC heterostructure was fabricated via RF magnetron sputtering technique. The device structural and optical properties were investigated before and after thermal treatment at different annealing temperature values varying from 300 °C to 600 °C. UV-Visible spectroscopy revealed that the annealing process has a beneficial effect in terms of high UV absorbance and solar-blindness properties. Photoelectrical characterization demonstrated the high UV photoresponse and low dark noise of the prepared UV PD based on all-amorphous ZnO/SiC structure. Improvement of the device performances were achieved by an appropriate annealing process. After post-annealing, the thermally treated ZnO/SiC UV PD at 500 °C exhibits a high detectivity of 2.4 × 10¹² Jones, high signal to noise ratio of 2.64×10⁵ and a giant UV–Vis rejection ratio of 5.9 × 10³. Therefore, the present study may provide new perspectives for fabricating ultralow dark noise solar-blind UV PD based on all-amorphous ZnO/SiC heterostructure, which promotes the development of integrated UV photonic systems based on SiC platform.

In this work, thin films of aluminum doped ZnO (AZO) were deposited on ultrasonically cleaned glass substrates by sol-gel process using dip and spin coating techniques. For this purpose, Zinc acetate dihydrate, aluminum nitrate nonahydrate, ethanol and mono ethanolamine were employed as precursor, dopant, solvent and stabilizer, respectively. X-ray diffraction, UV–vis, photoluminescence, 4-point probe and Van der pauw techniques were investigated for the characterization of the prepared AZO thin films. X-ray-analysis revealed that all the prepared films have hexagonal wurtzite structure with a relative preferential orientation along the c-axis and the lattice parameters are close to the standard values reported in literature. UV–vis spectroscopy showed that the average value of the films’ transmittance in the visible region is found to be around 85% and the gap ranges in the interval [3.15 eV–3.30 eV]. The photoluminescence spectrum only showed the UV peak while the broad band of the visible region was completely vanished. The electrical measurements indicate that sol-gel methods provide relatively high resistivities compared to those obtained with physical vapor deposition (PVD) techniques.

Zn(1–x)MgxO thin films with various concentrations of magnesium were deposited using the spray pyrolysis method. The transmittance spectra recorded for all films exhibit maxima exceeding 90%. The band gap energy of the films with wurtzite structure increases from 3.22 up to 3.60 eV by incorporating Mg into ZnO. However, when the atomic ratio of Mg exceeded 0.4, a second crystalline phase (assigned to cubic MgO) became discernable in XRD patterns, a compressive strain was observed in the wurtzite lattice, and crystallite sizes decreased significantly. In accordance with these observations, finer grains with a pronounced columnar growth were observed in 3D AFM representations and the surface roughness decreases significantly. Finally, selective etching in water yields to porous films with a great surface-to-volume ratio, a lower refractive index and a better light transmission. These porous films with tunable band gap seem to be excellent candidates to various interesting applications.