Nowadays, numerical modelling has become an interesting tool for determining impedance variations due to various conductive flaws in eddy current nondestructive evaluation systems. These kinds of defects, rarely treated in the published works, are taken into consideration in the modelling while introducing them as electrically conductive volumes with a finite electric resistivity. This step is very important since it permits to improve qualitatively several models developed so far by many authors whose consider the defect as loss of material only. However, in several applications, the defect can occur with a finite resistivity such as impurity, small burns and micro-solder. On the other hand, even though the defect appears with a loss of materials, som e polluting materials can fill the affected region. Indeed, the volume of the initial defect will be completely or partially occupied by these conducting pollutant materials. This paper deals with the effect of physical and geometrical characteristics of such kind of defects on the differential sensor response. Furthermore, the necessity of taking the defect electric conductivity (as an important parameter) into account will be explained, in order to develop a reliable and accurate inverse method allowing a full characterization of conductive defects.
This article presents a defect modeling in eddy current non-destructive testing systems by using a new developed method called coupled electric field. It permits to improve qualitatively several models developed so far by many authors using coupled circuit methods that consider the defect only as loss of material. However, a defect can occur with a finite conductivity such as impurity, small burns and micro-solder. For this reason, this investigation consists of extending the coupled circuit method to the modeling of this kind of defects. The proposed approach consists of firstly considering the defect as an electric conductive volume and secondly changing the state variable presenting the electric current by the electric field one. This procedure permits expressing explicitly the impedance variation caused by the presence of an axi-symmetrical defect according to its characteristics. The comparison between the impedance variations calculated using finite elements method and the proposed one demonstrates a very good concordance. After this validation, the study covers also the influence of the defect shape and position on encircling probe impedance. This method is interesting since it permits a fully characterization of this kind of defects and facilitates the inversion process. Moreover, using a 3D finite element observation, this fast tool of simulation can be adapted for a fast phenomenological modeling of asymmetrical configurations.