Citation:
Abderrahim Y, Zohir D, Mawloud G, Salim A. Modeling and Simulation of Double Gate Field Plate In_ (0.2) Ga_ (0.8) As/Al_ (0.3) Ga_ (0.7) as HEMT using Gaussian Process Regression for Sensor Application. Research Journal of Applied Sciences, Engineering and Technology. 2017;14 (3) :112-118.