@proceedings {4642,
	title = {ANFIS-based Approach to Predict the Degradation-related Ageing ofJunctionless GAA MOSFET},
	journal = {NN17},
	year = {2018},
	url = {https://doi.org/10.1016/j.matpr.2018.05.038},
	author = {Djeffal Fay{\c c}al}
}
