<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="7.x">Drupal-Biblio</source-app><ref-type>17</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Wail Rezgui</style></author><author><style face="normal" font="default" size="100%">Mouss Nadia Kenza</style></author><author><style face="normal" font="default" size="100%">Mouss Leila Hayet</style></author><author><style face="normal" font="default" size="100%">Mouss Mohamed Djamel</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Smart algorithm based on the optimization of SVR technique by k-NNR method for the prognosis of the open-circuit and the reversed polarity faults in a PV generator,  ISSN / e-ISSN  1974-9821 / 2533-1701</style></title><secondary-title><style face="normal" font="default" size="100%">International Review on Modelling and Simulations</style></secondary-title></titles><dates><year><style  face="normal" font="default" size="100%">2015</style></year></dates><urls><web-urls><url><style face="normal" font="default" size="100%">https://www.praiseworthyprize.org/jsm/index.php?journal=iremos&amp;page=article&amp;op=view&amp;path[]=16927</style></url></web-urls></urls><volume><style face="normal" font="default" size="100%">Vol 8</style></volume><pages><style face="normal" font="default" size="100%">863-870</style></pages><language><style face="normal" font="default" size="100%">eng</style></language><abstract><style face="normal" font="default" size="100%">This paper deals with a new smart algorithm allowing open-circuit and reversed polarity faults prognosis in photovoltaic generators. Its contribution lies on the optimization of support vector regression (SVR) technique by a k-NN regression tool (k-NNR) for undetermined outputs. To testing the performance of the proposed algorithm, we used a significant data base containing the generator functioning history, and as indicators we selected variance, standard deviation, Confidence interval, absolute and relative errors.</style></abstract><issue><style face="normal" font="default" size="100%">issue 1</style></issue></record></records></xml>